Odds ratios of having taken sick leave in the past year for selected exposure variables (n=968)
| Took sick leave within past year | ||||
|---|---|---|---|---|
| Exposure variables | Odds ratio | 95% CI | Adjusted odds ratio | 95% CI |
| Adjusted odds ratios were obtained by logistic regression analysis with the covariates that were significantly related to the dependent variable. These were marital status, work section, work schedule, use chemicals in work process, smell chemicals, and poor ventilation. | ||||
| Work section | ||||
| Wafer polishing | 3.02 | 1.78 to 5.13 | 2.49 | 1.44 to 4.32 |
| Semiconductor assembly | ||||
| Front of line | – | – | – | – |
| Middle of line | 1.19 | 0.79 to 1.80 | 0.95 | 0.61 to 1.47 |
| End of line | 1.24 | 0.88 to 1.75 | 1.33 | 0.93 to 1.89 |
| Parts assembly | 2.37 | 1.23 to 4.59 | 2.23 | 1.12 to 4.45 |
| Chemical hazards | ||||
| Use chemicals in work process | 1.53 | 1.18 to 1.98 | 1.06 | 0.67 to 1.67 |
| Smell chemicals (n=405) | 1.62 | 1.23 to 2.13 | 1.64 | 1.01 to 2.67 |
| Exposed to/dissatisfied with conditions | ||||
| Temperature—too hot | 1.39 | 0.80 to 2.42 | – | – |
| Temperature—too cold | 0.97 | 0.69 to 1.36 | – | – |
| Noise | 1.17 | 0.89 to 1.54 | – | – |
| Poor lighting | 1.85 | 0.73 to 4.68 | – | – |
| Poor ventilation | 2.95 | 1.64 to 5.29 | 2.30 | 1.25 to 4.25 |