Odds ratios of having taken sick leave for more than three days in the past year for selected exposure variables (n=968)
| Took >3 days sick leave within past year | ||||
|---|---|---|---|---|
| Exposure variables | Odds ratio | 95% CI | Adjusted odds ratio | 95% CI |
| Adjusted odds ratios were obtained by logistic regression analysis with the covariates that were significantly related to the dependent variable. These were marital status, no. of years worked in factory, work section, use chemicals in work process, smell chemicals, poor lighting, and poor ventilation. | ||||
| Work section | ||||
| Wafer polishing | 3.61 | 1.52 to 8.56 | 3.27 | 1.35 to 7.92 |
| Semiconductor ssembly | ||||
| Front of line | 1.13 | 0.49 to 2.64 | 1.18 | 0.50 to 2.81 |
| Middle of line | 1.23 | 0.53 to 2.86 | 1.07 | 0.45 to 2.54 |
| End of line | 1.21 | 0.55 to 2.68 | 1.33 | 0.59 to 3.01 |
| Parts assembly | – | – | – | – |
| Chemical hazards | ||||
| Use chemicals in work process | 1.62 | 1.19 to 2.21 | 1.34 | 0.78 to 2.30 |
| Smell chemicals (n=405) | 1.59 | 1.15 to 2.18 | 1.26 | 0.72 to 2.21 |
| Exposed to/dissatisfied with conditions | ||||
| Temperature—too hot | 1.55 | 0.85 to 2.84 | – | – |
| Temperature—too cold | 1.14 | 0.75 to 1.71 | – | – |
| Noise | 1.29 | 0.93 to 1.79 | – | – |
| Poor lighting | 3.10 | 1.27 to 7.58 | 1.74 | 0.63 to 4.80 |
| Poor ventilation | 2.38 | 1.39 to 4.09 | 1.63 | 0.87 to 3.06 |